Dr. Sina Simingalam is a Senior Test Engineer at SBM. Sina graduated with his BS in Physics in 2010, MS in Applied Physics and Engineering in 2012 and his Doctorate in Physics in 2015 from George Mason University. He spent 5 years at the U.S. Army Research Laboratory (ARL) in Adelphi, MD under the Sensors and Electron Devices Directorate (SEDD) where he worked to decrease the dislocation density of HgCdTe epilayers grown on CdTe/Si substrates to reduce the cost and increase the size of infrared sensor arrays and reduced the dislocation density down to a level equivalent to the state-of-the-art, but expensive HgCdTe grown on bulk CdZnTe substrates. He accomplished this by creating a novel low temperature annealing scheme on etched mesa bars and showed improved device performance characteristics of the low dislocation density devices over the standard p-n devices of HgCdTe on CdTe/Si. As a Senior Test Engineer at SBM, Sina is working at the Device Development Laboratory at NASA on Transition Edge Sensor bolometers for the CLASS survey that is searching for evidence of gravitational waves.